Paper
12 April 2023 A simulation method of accuracy prediction based on axis vector rendezvous for medium and long distance pose measurement
Xiaoli Hu, Minggang Tang, Yu Wang, Yulun Zhang
Author Affiliations +
Proceedings Volume 12565, Conference on Infrared, Millimeter, Terahertz Waves and Applications (IMT2022); 1256524 (2023) https://doi.org/10.1117/12.2662572
Event: Conference on Infrared, Millimeter, Terahertz Waves and Applications (IMT2022), 2022, Shanghai, China
Abstract
To reflect the pose measurement reliability under the real measurement track and provide the basis for station layout in advance and post-processing, a closed-loop error analysis method based on line vector pure direction projection and reverse reconstruction is proposed. Firstly, the central axis method is simplified and the key errors are located, according to the process of pose simulation - perspective projection - key parameter error acquisition - central axis reconstruction - pose accuracy acquisition, in this paper the accuracy evaluation method of central axis pose rendezvous measurement with closed-loop feedback establishes is established for the first time. Compared with the traditional partial derivative method, it not only highlights the influence of key parameters, but also is convenient, intuitive and accurate, Moreover, the problem of unknown key parameters is solved. This method provides a reliable theoretical support for station layout test, accuracy prediction and post analysis for range pose measurement.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaoli Hu, Minggang Tang, Yu Wang, and Yulun Zhang "A simulation method of accuracy prediction based on axis vector rendezvous for medium and long distance pose measurement", Proc. SPIE 12565, Conference on Infrared, Millimeter, Terahertz Waves and Applications (IMT2022), 1256524 (12 April 2023); https://doi.org/10.1117/12.2662572
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KEYWORDS
Error analysis

Distance measurement

Defense and security

Imaging systems

Optical testing

3D metrology

Defense technologies

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