Paper
30 April 2024 Tiled and layer-adaptive three-dimensional structured illumination microscopy based on principal component analysis
Weiyi Xia, Jiaming Qian, Pengfei Fan, Chao Zuo
Author Affiliations +
Proceedings Volume 13155, Sixth Conference on Frontiers in Optical Imaging and Technology: Novel Imaging Systems; 1315517 (2024) https://doi.org/10.1117/12.3019549
Event: Sixth Conference on Frontiers in Optical Imaging Technology and Applications (FOI2023), 2023, Nanjing, JS, China
Abstract
Three-dimensional (3D) Structured illumination microscopy (SIM) has become one of the most commonly implemented fluorescence super-resolution modes in life sciences due to its unique advantages of wide field of view, fast imaging, and weak phototoxicity and photobleaching. However, the traditional two-dimensional (2D) SIM suffers from the "missing cone” problem, which makes it impossible to realize true three-dimensional (3D) imaging. In order to solve this problem, 3D SIM has been developed to achieve twice the resolution in both lateral and axial directions. Recently, we propose a tiled and layer-adaptive 3D SIM based on principal component analysis (PCA) to solve the computational complexity and time-consuming, local perturbation of illumination parameters, and microscope moving mechanical errors faced by 3D SIM in parameter estimation. The algorithm accelerates and improves the accuracy of transverse and axial illumination parameters, which is expected to achieve fast, iteration-free, high-precision, high-quality 3D SIM super-resolution imaging.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Weiyi Xia, Jiaming Qian, Pengfei Fan, and Chao Zuo "Tiled and layer-adaptive three-dimensional structured illumination microscopy based on principal component analysis", Proc. SPIE 13155, Sixth Conference on Frontiers in Optical Imaging and Technology: Novel Imaging Systems, 1315517 (30 April 2024); https://doi.org/10.1117/12.3019549
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