Relative quantum efficiency measurements of CsI, CsBr, and CsI/CsBr coated microchannel plates

Rachel K. Martin; John H. Chappell; Stephen S. Murray

doi:10.1117/12.23262

1 November 1990 Relative quantum efficiency measurements of CsI, CsBr, and CsI/CsBr coated microchannel plates

Rachel K. Martin, John H. Chappell, Stephen S. Murray

Proceedings Volume 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy; (1990) https://doi.org/10.1117/12.23262
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

The soft X-ray quantum efficiencies of CsI and CsBr coated microchannel plates (MCPs) are described. These two materials are deposited on an MCP in quadrants. The quadrants are coated with CsI, CsBr, and a mixture of CsI and CsBr. The paper reports on the deposition techniques, background characteristics, imaging quality, and relative quantum efficiency over a selected range of X-ray energies from 0.1 KeV to 4.5 KeV.

Citation Download Citation

Rachel K. Martin, John H. Chappell, and Stephen S. Murray "Relative quantum efficiency measurements of CsI, CsBr, and CsI/CsBr coated microchannel plates", Proc. SPIE 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, (1 November 1990); https://doi.org/10.1117/12.23262

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