Paper
1 January 1991 Techniques of production and analysis of polarized synchrotron radiation
Dennis M. Mills
Author Affiliations +
Abstract
The use of the unique polarization properties of synchrotron radiation in the hard x-ray spectral region (E KeY) is becoming increasingly important to many synchrotron radiation researchers. The radiation emitted from bending magnets and conventional (planar) insertion devices (IDs) is highly linearly polarized in the plane of the particle''s orbit. Elliptically polarized x-rays can also be obtained by going offaxis on a bending magnet source albeit with considerable loss of flux. The polarization properties of synchrotron radiation can be further tailored to the researcher''s specific needs through the use of specialized insertion devices such as helical and crossed undulators and asymmetrical wigglers. Even with the possibility of producing a specific polarization there is still the need to develop x-ray optical components which can manipulate the polarization for both analysis and further modification of the polarization state. A survey of techniques for producing and analyzing both linear and circular polarized xrays will be presented with emphasis on those techniques which rely on single crystal optical components. 1.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dennis M. Mills "Techniques of production and analysis of polarized synchrotron radiation", Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, (1 January 1991); https://doi.org/10.1117/12.23309
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Polarization

Crystals

X-rays

Diffraction

Synchrotron radiation

Absorption

Laser crystals

RELATED CONTENT

X-ray optics for nuclear inelastic scattering
Proceedings of SPIE (December 11 1997)
High-energy x-ray diffraction
Proceedings of SPIE (January 01 1991)
X ray diffraction studies of the performance of Si TaSi2...
Proceedings of SPIE (December 11 1997)

Back to Top