Some solutions to vision dimensional metrology problems

Sabry F. El-Hakim

doi:10.1117/12.2294304

1 August 1990 Some solutions to vision dimensional metrology problems

Sabry F. El-Hakim

Proceedings Volume 1395, Close-Range Photogrammetry Meets Machine Vision; 13951P (1990) https://doi.org/10.1117/12.2294304
Event: Close-Range Photogrammetry Meets Machine Vision, 1990, Zurich, Switzerland

Abstract

New applications continue to emerge for machine vision and real-time photogrammetry, particularly in industrial inspection and biomedicine. Solutions to automation and practical problems are the key to the success of this relatively new technology. Calibration, illumination, edge definition and integration with a priori known information are addressed.

Citation Download Citation

Sabry F. El-Hakim "Some solutions to vision dimensional metrology problems", Proc. SPIE 1395, Close-Range Photogrammetry Meets Machine Vision, 13951P (1 August 1990); https://doi.org/10.1117/12.2294304

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