Optical delay tester

Shin-ichi Wakana; Toshiaki Nagai; Soichi Hama; Yoshiro Goto

doi:10.1117/12.44538

1 August 1991 Optical delay tester

Shin-ichi Wakana, Toshiaki Nagai, Soichi Hama, Yoshiro Goto

Proceedings Volume 1479, Surveillance Technologies; (1991) https://doi.org/10.1117/12.44538
Event: Orlando '91, 1991, Orlando, FL, United States

Abstract

The authors have developed an optical delay tester based on electro-optic sampling, and designed a prototype to test the timing of high-speed IC chips. The device puts an electro-optic crystal in contact with the terminals to be tested and measures the voltage waveform applied to the crystal. Measurement precision is 100 mV or better and timing precision measurement is 50 ps.

Citation Download Citation

Shin-ichi Wakana, Toshiaki Nagai, Soichi Hama, and Yoshiro Goto "Optical delay tester", Proc. SPIE 1479, Surveillance Technologies, (1 August 1991); https://doi.org/10.1117/12.44538

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