Contouring by DSPI for surface inspection

Domenica Paoletti; Giuseppe Schirripa Spagnolo

doi:10.1117/12.49511

1 December 1991 Contouring by DSPI for surface inspection

Domenica Paoletti, Giuseppe Schirripa Spagnolo

Proceedings Volume 1554, Second International Conference on Photomechanics and Speckle Metrology; (1991) https://doi.org/10.1117/12.49511
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

A contouring technique based on digital speckle pattern interferometry is developed for investigation of surface defects in deterioration studies. A specific software is proposed for an automatic quantitative evaluation of defect dimensions. Some experimental tests effected on laboratory samples have demonstrated the suitability of the method.

Citation Download Citation

Domenica Paoletti and Giuseppe Schirripa Spagnolo "Contouring by DSPI for surface inspection", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); https://doi.org/10.1117/12.49511

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