Determination of the refractive index profile of integrated optical waveguides from near-field measurements

M. Halfmann; Lubomir Sumichrast; Walter E. Heinlein

doi:10.1117/12.637018

16 December 1992 Determination of the refractive index profile of integrated optical waveguides from near-field measurements

M. Halfmann, Lubomir Sumichrast, Walter E. Heinlein

Author Affiliations +

Proceedings Volume 1622, Emerging Optoelectronic Technologies; (1992) https://doi.org/10.1117/12.637018
Event: Emerging OE Technologies, Bangalore, India, 1991, Bangalore, India

Abstract

The refractive-index profile of optical waveguides can be obtained from transmitted near-field intensity measurements by the method of transverse offset scanning. As the calculation of the refractive-index profile from the scalar wave equation requires the second derivative of the field distribution, we developed a modified measurement setup, the modulated transverse offset scanning method.

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M. Halfmann, Lubomir Sumichrast, and Walter E. Heinlein "Determination of the refractive index profile of integrated optical waveguides from near-field measurements", Proc. SPIE 1622, Emerging Optoelectronic Technologies, (16 December 1992); https://doi.org/10.1117/12.637018

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