Decenter and defocus for testing aspheric surfaces

Der-Shen Wan

doi:10.1117/12.139236

15 December 1992 Decenter and defocus for testing aspheric surfaces

Der-Shen Wan

Proceedings Volume 1776, Interferometry: Surface Characterization and Testing; (1992) https://doi.org/10.1117/12.139236
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

Testing profiles of aspheric surfaces at various stages of figuring is essential, and a simple algorithm for finding the surface profile is very helpful. In order to find the wave front fourth order spherical aberration, a new algorithm resorting to decenter and defocus is presented here.

Citation Download Citation

Der-Shen Wan "Decenter and defocus for testing aspheric surfaces", Proc. SPIE 1776, Interferometry: Surface Characterization and Testing, (15 December 1992); https://doi.org/10.1117/12.139236

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