Paper
21 September 1979 Making Real-Time Sun Reflectance Measurements With A Microprocessor-Based Spectroradiometer
Frederic M. Zweibaum, Emmett W. Chapelle
Author Affiliations +
Proceedings Volume 0180, Real-Time Signal Processing II; (1979) https://doi.org/10.1117/12.957336
Event: Technical Symposium East, 1979, Washington, D.C., United States
Abstract
A standard high-speed, field-portable spectroradiometric measurement system built around a programmable microprocessor has been adapted to the form of a Reflectometer/Comparator. In this configuration, the instrument makes passive measurements of the absolute reflectance of agricultural plant canopies over a spectral range of 0.4 to 2.5 micrometers. Realtime absolute measurements are made possible by a unique optical chopper which constantly compares the target with the sun and derives the ratio, which is the reflectance. Extensive measurements of solar reflectance from a variety of these targets have been made. The paper describes the instrumentation and measurement procedures, reviews the software programming and discusses the results.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Frederic M. Zweibaum and Emmett W. Chapelle "Making Real-Time Sun Reflectance Measurements With A Microprocessor-Based Spectroradiometer", Proc. SPIE 0180, Real-Time Signal Processing II, (21 September 1979); https://doi.org/10.1117/12.957336
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KEYWORDS
Reflectivity

Calibration

Head

Sun

Signal processing

Optical filters

Fiber optics

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