Paper
9 August 1979 Effects Of Scattering On X-Ray Imaging
Robert J. Noll
Author Affiliations +
Proceedings Volume 0184, Space Optics Imaging X-Ray Optics Workshop; (1979) https://doi.org/10.1117/12.957452
Event: 1979 Huntsville Technical Symposium, 1979, Huntsville, United States
Abstract
Very high spatial frequency irregularities with small amplitude on a polished surface that usually cause wide-angle scattering in conventional optical systems produce narrow-angle scattering in X-ray systems. Yet, even this small amount of scattering degrades the imaging properties of X-ray systems. Statistical surface perturbations and their effects on X-ray image quality are discussed. A model of surface roughness that is reasonably consistent with surface-profile measurements and visible-scatter-profile measurement is discussed. This model is then used to evaluate the image profile of an X-ray system.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert J. Noll "Effects Of Scattering On X-Ray Imaging", Proc. SPIE 0184, Space Optics Imaging X-Ray Optics Workshop, (9 August 1979); https://doi.org/10.1117/12.957452
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KEYWORDS
Scattering

Surface roughness

Correlation function

X-ray optics

X-rays

Spatial frequencies

Mirrors

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