Paper
17 December 1993 Inspection methods for geometric and symbolic shape features
Bruce G. Batchelor, A. David Marshall, Ralph R. Martin
Author Affiliations +
Proceedings Volume 1989, Computer Vision for Industry; (1993) https://doi.org/10.1117/12.164858
Event: Electronic Imaging Device Engineering, 1993, Munich, Germany
Abstract
Opto-electronic sensing methods are increasingly being used for the inspection of manufactured goods. Such systems have the advantage of being non-contact methods, and are fast and flexible. One particular aspect of inspection is the measurement of 3D shape. Even in shape measurement, there is a wide range of requirements. Some components, such as mechanical parts, may have exacting geometric requirements if they are to function correctly. Here, inspection is concerned with checking geometric details. Correctness of other objects such as loaves of bread is much more difficult to pin down, and symbolic methods are more appropriate than high-precision numerical methods. This paper considers a range of inspection tasks, and appropriate methods for carrying them out using visual sensing techniques.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bruce G. Batchelor, A. David Marshall, and Ralph R. Martin "Inspection methods for geometric and symbolic shape features", Proc. SPIE 1989, Computer Vision for Industry, (17 December 1993); https://doi.org/10.1117/12.164858
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KEYWORDS
Inspection

Image segmentation

Optical inspection

Imaging systems

Tin

Computer vision technology

Image processing

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