X-ray dosimetry with low-capacitance silicon detector

Doina N. Lazarovici; Cristian C. Lazarovici; Valerica Cimpoca; Radu Ruscu; Gh. Caragheorgheopol; Eugenia T. Halmagean; Marian N. Udrea-Spinea; S. Negru; A. Paunescu; L. Staicu

doi:10.1117/12.164727

16 December 1993 X-ray dosimetry with low-capacitance silicon detector

Doina N. Lazarovici, Cristian C. Lazarovici, Valerica Cimpoca, Radu Ruscu, Gh. Caragheorgheopol, Eugenia T. Halmagean, Marian N. Udrea-Spinea, S. Negru, A. Paunescu, L. Staicu

Author Affiliations +

Proceedings Volume 2009, X-Ray Detector Physics and Applications II; (1993) https://doi.org/10.1117/12.164727
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

The paper presents a low capacitance, low reverse current, suited for x-ray dosimetry at room temperature. The detector is a `drift chamber' type, with a transversal field collection of charge carriers. Based on the low noise performance of the detector and the first stage of electronics, a pocket size x-ray dose ratemeter is proposed, for the 10...60 keV energy range.

Citation Download Citation

Doina N. Lazarovici, Cristian C. Lazarovici, Valerica Cimpoca, Radu Ruscu, Gh. Caragheorgheopol, Eugenia T. Halmagean, Marian N. Udrea-Spinea, S. Negru, A. Paunescu, and L. Staicu "X-ray dosimetry with low-capacitance silicon detector", Proc. SPIE 2009, X-Ray Detector Physics and Applications II, (16 December 1993); https://doi.org/10.1117/12.164727

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