Submicron diffraction gratings etched on an InP/InGaAsP waveguide edge for wavelength division multiplexing

Elizabeth J. Twyford; Nan Marie Jokerst; Paul A. Kohl

doi:10.1117/12.179126

29 June 1994 Submicron diffraction gratings etched on an InP/InGaAsP waveguide edge for wavelength division multiplexing

Elizabeth J. Twyford, Nan Marie Jokerst, Paul A. Kohl

Author Affiliations +

Proceedings Volume 2240, Advances in Optical Information Processing VI; (1994) https://doi.org/10.1117/12.179126
Event: SPIE's International Symposium on Optical Engineering and Photonics in Aerospace Sensing, 1994, Orlando, FL, United States

Abstract

2D monolithic grating spectrometers for dense wavelength division multiplexing (WDM) show considerable promise to extend the usable bandwidth of optical fibers. Their performance is fundamentally dictated by the grating which is used. First order gratings will theoretically improve the performance of monolithic WDM devices, since WDM devices based on first order gratings do not suffer from an inherent tradeoff between efficiency and broadband operation.

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Elizabeth J. Twyford, Nan Marie Jokerst, and Paul A. Kohl "Submicron diffraction gratings etched on an InP/InGaAsP waveguide edge for wavelength division multiplexing", Proc. SPIE 2240, Advances in Optical Information Processing VI, (29 June 1994); https://doi.org/10.1117/12.179126

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