Common-path holographic interferometer for flatness testing

Pierre M. Jacquot; Xavier Colonna de Lega; Pierre Michel Boone

doi:10.1117/12.194311

15 November 1994 Common-path holographic interferometer for flatness testing

Pierre M. Jacquot, Xavier Colonna de Lega, Pierre Michel Boone

Proceedings Volume 2248, Optical Measurements and Sensors for the Process Industries; (1994) https://doi.org/10.1117/12.194311
Event: Optics for Productivity in Manufacturing, 1994, Frankfurt, Germany

Abstract

An interferometer based on a single multi-functional holographic optical element (HOE) is presented. The interferometer is meant for flatness testing of quite large objects, not necessarily optically polished. Other features include two beam common-path arrangement, desensitization as compared to the classical (lambda) /2) figure, white-light illumination. Emphasis is then laid on automatic fringe pattern interpretation which makes use of an ad hoc phase-shifting procedure. Results obtained with computer disks are shown.

Citation Download Citation

Pierre M. Jacquot, Xavier Colonna de Lega, and Pierre Michel Boone "Common-path holographic interferometer for flatness testing", Proc. SPIE 2248, Optical Measurements and Sensors for the Process Industries, (15 November 1994); https://doi.org/10.1117/12.194311

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available