Novel accurate measurement technique for carrier lifetime in 1.5-um semiconductor laser

Marina Meliga; Roberto Paoletti; Marco Bello; Luca Cicchelli; Ivo Montrosset

doi:10.1117/12.206929

24 April 1995 Novel accurate measurement technique for carrier lifetime in 1.5-μm semiconductor laser

Marina Meliga, Roberto Paoletti, Marco Bello, Luca Cicchelli, Ivo Montrosset

Proceedings Volume 2397, Optoelectronic Integrated Circuit Materials, Physics, and Devices; (1995) https://doi.org/10.1117/12.206929
Event: Photonics West '95, 1995, San Jose, CA, United States

Abstract

We propose a new accurate method for differential carrier lifetime measurement, in which the laser under test biased below threshold is optically modulated. Experimental results are very reproducible and show very high signal/noise ratio. No additional technological process for the laser under test are required.

Citation Download Citation

Marina Meliga, Roberto Paoletti, Marco Bello, Luca Cicchelli, and Ivo Montrosset "Novel accurate measurement technique for carrier lifetime in 1.5-μm semiconductor laser", Proc. SPIE 2397, Optoelectronic Integrated Circuit Materials, Physics, and Devices, (24 April 1995); https://doi.org/10.1117/12.206929

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