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14 June 1995 Investigation of the Fourier transform method in analysis of photo-carrier fringe patterns
Xide Li, Zheng Zhang, Xiaoping Wu
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Proceedings Volume 2544, Interferometry VII: Techniques and Analysis; (1995) https://doi.org/10.1117/12.211875
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States
Abstract
The factors that affect the accuracy of photo-carrier technique are mainly speckle noise, additive random noise, gradient change of phase function and boundary. They have been simulated by a microcomputer and their effects on phase demodulation when FFT method is used have been studied in this paper. Besides, the bandwidth and undistorted demodulation characteristics in photo-carrier measurement have been investigated with FFT analysis method.
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Xide Li, Zheng Zhang, and Xiaoping Wu "Investigation of the Fourier transform method in analysis of photo-carrier fringe patterns", Proc. SPIE 2544, Interferometry VII: Techniques and Analysis, (14 June 1995); https://doi.org/10.1117/12.211875
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KEYWORDS
Fringe analysis
Demodulation
Speckle
Computer simulations
Fourier transforms
Signal to noise ratio
Convolution
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