Paper
14 June 1995 Random phase measurement errors in digital speckle pattern interferometry
Author Affiliations +
Abstract
Phase measurements using digital speckle pattern interferometry are subject to random errors due to speckle decorrelation and electronic noise. A phasor description of speckle decorrelation is introduced from which the r.m.s. phase error is calculated. Phase noise due to additive Gaussian errors on the phase-stepped images is shown to be statistically equivalent to that from decorrelation, allowing the r.m.s. phase error from electronic noise to be obtained analytically. The currently used noise reduction strategy of speckle averaging is shown to be optimal in that it provides the maximum likelihood estimate of speckle phase change. Finally, the effect of speckle integration implicit in digitization by pixels of finite size is considered using computer-generated speckle patterns. It is shown that the phase errors decrease monotonically with decreasing speckle diameter.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jonathan Mark Huntley "Random phase measurement errors in digital speckle pattern interferometry", Proc. SPIE 2544, Interferometry VII: Techniques and Analysis, (14 June 1995); https://doi.org/10.1117/12.211885
Lens.org Logo
CITATIONS
Cited by 7 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Speckle

Speckle pattern

Error analysis

Phase measurement

Speckle interferometry

Image sensors

Interferometry

Back to Top