Interferometric deformation measurement using object-induced dynamic phase-shifting

Xavier Colonna de Lega; Pierre M. Jacquot

doi:10.1117/12.250742

18 September 1996 Interferometric deformation measurement using object-induced dynamic phase-shifting

Xavier Colonna de Lega, Pierre M. Jacquot

Proceedings Volume 2782, Optical Inspection and Micromeasurements; (1996) https://doi.org/10.1117/12.250742
Event: Lasers, Optics, and Vision for Productivity in Manufacturing I, 1996, Besancon, France

Abstract

A new method is presented that allows continuous deformation measurements to be performed. It is based on the use of the deformation-induced phase change produced at each pixel to compute an instantaneous phase with a dedicated phase- shifting algorithm. Examples in holographic, speckle and decorrelated speckle interferometry illustrate the interest of the method which provides both relative displacement phase maps and absolute temporal phase evolution curves.

Citation Download Citation

Xavier Colonna de Lega and Pierre M. Jacquot "Interferometric deformation measurement using object-induced dynamic phase-shifting", Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); https://doi.org/10.1117/12.250742

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available