Paper
19 July 1996 New simple ESPI configurations for deformation studies on large structures based on diffused reference beam
Author Affiliations +
Abstract
Two simple Electronic Speckle Pattern Interferometer (ESPI) configurations have been devised based on diffused reference beam which provides out-of-plane displacement data over the whole field. Both configurations use a tiny diffuser to generate the reference beam. This makes the system insensitive to reference beam misalignment, simplifies the construction of ESPI setup and allows larger area of observation unlike the conventional ESPI system. Thermal deflection studies on a cantilever plate have been carried out. Experimental results and features over the conventional ESPI system are discussed.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. Santhanakrishnan, Nandigana K. Krishna Mohan, and Rajpal S. Sirohi "New simple ESPI configurations for deformation studies on large structures based on diffused reference beam", Proc. SPIE 2861, Laser Interferometry VIII: Applications, (19 July 1996); https://doi.org/10.1117/12.245174
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Diffusers

CCD cameras

Speckle pattern

Cameras

Interferometers

Mirrors

Image processing

Back to Top