Paper
31 December 1996 Phase unwrapping techniques for 3D shape measurement
Author Affiliations +
Proceedings Volume 2866, International Conference on Holography and Optical Information Processing (ICHOIP '96); (1996) https://doi.org/10.1117/12.263022
Event: International Conference on Holography and Optical Information Processing, 1996, Nanjing, China
Abstract
This paper gives an overview of phase unwrapping techniques for complex shape measurement. These techniques include phase unwrapping based on binary control mask, phase unwrapping based on ordering reliability, 2D filtering in Fourier transform profilometry, two-frequency grating phase unwrapping, et al.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xianyu Su "Phase unwrapping techniques for 3D shape measurement", Proc. SPIE 2866, International Conference on Holography and Optical Information Processing (ICHOIP '96), (31 December 1996); https://doi.org/10.1117/12.263022
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Cited by 17 scholarly publications.
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KEYWORDS
Phase shift keying

Fringe analysis

Modulation

Reliability

3D metrology

Binary data

Fourier transforms

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