Nanosecond Gating Properties Of Proximity-Focused Microchannel-Plate Image Intensifiers

N. S.P. King; G. J. Yates; S. A. Jaramillo; J. W. Ogle; J. L. Detch Jr.

doi:10.1117/12.932081

30 December 1981 Nanosecond Gating Properties Of Proximity-Focused Microchannel-Plate Image Intensifiers

N. S.P. King, G. J. Yates, S. A. Jaramillo, J. W. Ogle, J. L. Detch Jr.

Proceedings Volume 0288, Los Alamos Conf on Optics '81; (1981) https://doi.org/10.1117/12.932081
Event: Los Alamos Conference on Optics, 1981, Los Alamos, United States

Abstract

Some fundamental properties of 18-mm-diam gated proximity-focussed microchannel-plate (MCP) image intensifiers used as fast image shutters in the 1 to 10 ns range have been identified and studied. Light pulses (≈ 5-ps-wide) from a modelocked dye laser optically sample the gated MCP. Shuttering is achieved by applying a forward-biasing electrical gate pulse to the quiescently reverse-biased photocathode-MCP interface. Variable delay (≈ 30-ps jitter) between the gate pulse and the laser pulse permit tracing the MCP's optical response. Gating speeds, turn-on and turn-off patterns, the asymmetric spatial dependence of the MCP optical response, and resolution effects as functions of gate pulse width and photocathode-MCP bias have been characterized. Shutter times of ≥ 750 ps and ≤ 5 1p/mm resolution with the MCP fully on were observed. Variations in the intensity profiles of the phosphorl.s spatial response for uniform photocathode illumination are measured with a calibrated silicon-intensified-target (SIT) focus projection, scan (FPS) television camera and a high-speed video digitizer while photomultipliers (PMTs) monitor the laser pulse and the phosphor's spatially integrated output intensities. The characterization system, gating and biasing circuits, and experimental results will be presented.

Citation Download Citation

N. S.P. King, G. J. Yates, S. A. Jaramillo, J. W. Ogle, and J. L. Detch Jr. "Nanosecond Gating Properties Of Proximity-Focused Microchannel-Plate Image Intensifiers", Proc. SPIE 0288, Los Alamos Conf on Optics '81, (30 December 1981); https://doi.org/10.1117/12.932081

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