Defect measurement using structured light system

Siew-Lok Toh; W. K. Low; Cho Jui Tay; Huai Min Shang; Anand Krishna Asundi

doi:10.1117/12.269871

20 March 1997 Defect measurement using structured light system

Siew-Lok Toh, W. K. Low, Cho Jui Tay, Huai Min Shang, Anand Krishna Asundi

Proceedings Volume 2921, International Conference on Experimental Mechanics: Advances and Applications; (1997) https://doi.org/10.1117/12.269871
Event: International Conference on Experimental Mechanics: Advances and Applications, 1996, Singapore, Singapore

Abstract

Automated machine visual inspection, using non-contact optical means, is a fast and efficient approach for quality control and manufacturing process monitoring. One application is in shape measurement and defect detection which employs a structured light system based on the projection moire method. The fringe patterns of these specimens are obtained by pulsing a single strip of light from a diode laser on the rotating specimens. Defects on these surfaces can be observed when a single strip of light bends proportionally to their depths. The imaging of these fringes is done by a charge coupled device (CCD) camera operating at the time delay and integrating (TDI) mode. By synchronizing the camera scanning speed and the specimen's rotational speed, the 'unwrapped' surface fringe patterns can be obtained and viewed by a computer. The fast Fourier transformation (FFT) technique is used for quantitative measurement of the surface defect.

Citation Download Citation

Siew-Lok Toh, W. K. Low, Cho Jui Tay, Huai Min Shang, and Anand Krishna Asundi "Defect measurement using structured light system", Proc. SPIE 2921, International Conference on Experimental Mechanics: Advances and Applications, (20 March 1997); https://doi.org/10.1117/12.269871

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