Electronic speckle interferometry with pulsed lasers and practical applications

Hans Steinbichler; Steffen Leidenbach

doi:10.1117/12.281159

17 September 1997 Electronic speckle interferometry with pulsed lasers and practical applications

Hans Steinbichler, Steffen Leidenbach

Proceedings Volume 3098, Optical Inspection and Micromeasurements II; (1997) https://doi.org/10.1117/12.281159
Event: Lasers and Optics in Manufacturing III, 1997, Munich, Germany

Abstract

Electronic speckle pattern interferometry (ESPI) with CW- lasers is well introduced in the industry. Using pulse lasers in combination with ESPI techniques expands the technical applications. The combination of double pulse lasers with the ESPI-technique is considered as essential for the industrial application. It expands the application of ESPI systems to the investigation of transient events and the vibration analysis of components under free boundary conditions. However, due to the limited resolution of the CCD-cameras the interferograms show lower signal-to-noise ratio which requests special treatment of the images and new evaluation algorithms, in particular for 3D analysis. First practical applications have already been carried out in the automotive industry.

Citation Download Citation

Hans Steinbichler and Steffen Leidenbach "Electronic speckle interferometry with pulsed lasers and practical applications", Proc. SPIE 3098, Optical Inspection and Micromeasurements II, (17 September 1997); https://doi.org/10.1117/12.281159

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