Paper
20 April 1998 X-ray introscopic digital systems of nondestructive testing based on SELDI detectors
Vladimir D. Ryzhikov, Leonid P. Gal'chinetsky, Alexandr D. Opolonin, Vladimir M. Svishch, E. M. Selegenev
Author Affiliations +
Proceedings Volume 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997; (1998) https://doi.org/10.1117/12.306255
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1997, Kiev, Ukraine
Abstract
The receiving-detecting unit using scintillator-photodiode type detectors can be a basis for introscopic systems, industrial non-destructive testing instruments, devices for medical and technical tomography, fluorography, etc., have been developed.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladimir D. Ryzhikov, Leonid P. Gal'chinetsky, Alexandr D. Opolonin, Vladimir M. Svishch, and E. M. Selegenev "X-ray introscopic digital systems of nondestructive testing based on SELDI detectors", Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); https://doi.org/10.1117/12.306255
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KEYWORDS
Sensors

Scintillators

X-rays

Nondestructive evaluation

Photodiodes

Crystals

X-ray detectors

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