New 3D profilometry based on modulation measurement

Xianyu Su; Likun Su; Wansong Li; Liqun Xiang

doi:10.1117/12.318337

10 August 1998 New 3D profilometry based on modulation measurement

Xianyu Su, Likun Su, Wansong Li, Liqun Xiang

Proceedings Volume 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II; (1998) https://doi.org/10.1117/12.318337
Event: Photonics China '98, 1998, Beijing, China

Abstract

This article propose a new optical method for 3-D profilometry, it is not based on the conventional method of structured light triangulation, but on modulation measurement(we briefly call it MMP). Its main advantage is that it can measure the surface of a testing object in the same direction of projecting light, so it has no the difficulties due to shadow and spatial discontinuity that exist in PMP and FTP methods and needn't to know the phases. We have measured some objects to verify this method and got some meaningful results. The results proved that this method can be useful to 3-D profilometry .. 3-D sensing machine vision and so on.

Citation Download Citation

Xianyu Su, Likun Su, Wansong Li, and Liqun Xiang "New 3D profilometry based on modulation measurement", Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); https://doi.org/10.1117/12.318337

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