Paper
6 September 1999 Measuring the absolute planarity of test plates with a modified Fritz's method
Vincenzo Greco, Giuseppe Molesini
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Abstract
The Fritz's method using Zernike polynomials to assess the absolute planarity of test plates is revisited. Such method is based on four interferometric measurements, which are assumed perfectly correlated. In experiments, due to several instability sources, the data set is missing perfect correlation. Modifications of the Fritz's method are here presented, taking into account the residual uncorrelation of the data; such modified approach is demonstrated on a data set from experiments, achieving nanometer uncertainty level.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vincenzo Greco and Giuseppe Molesini "Measuring the absolute planarity of test plates with a modified Fritz's method", Proc. SPIE 3739, Optical Fabrication and Testing, (6 September 1999); https://doi.org/10.1117/12.360152
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KEYWORDS
Interferometry

Zernike polynomials

Data acquisition

Interferometers

Computer programming

Optical testing

Silicon

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