Heterodyne temporal speckle pattern interferometry

Hans J. Tiziani; Mahendra P. Kothiyal; Charles Joenathan; Pascal Haible

doi:10.1117/12.355067

19 July 1999 Heterodyne temporal speckle pattern interferometry

Hans J. Tiziani, Mahendra P. Kothiyal, Charles Joenathan, Pascal Haible

Proceedings Volume 3749, 18th Congress of the International Commission for Optics; (1999) https://doi.org/10.1117/12.355067
Event: ICO XVIII 18th Congress of the International Commission for Optics, 1999, San Francisco, CA, United States

Abstract

Multiple wavelength interferometry is used to increase the range of unambiguity beyond that of single wavelength interferometry. In wavelength scanning interferometry, the frequency of the intensity modulation induced by the wavelength change is determined independently for each image pixel. The tuning range determines the resolution of measurements, while the tuning step limits the range of the measurements. Laser diodes can be tuned, but an external cavity is needed for a larger mode hop free wavelength variation. Polished and optically rough surfaces can be analyzed in the same manner. Acquisition times of a few seconds and high resolutions were obtained. In a new development, the application of temporal evaluation of speckles for deformation and shape measurement will be discussed. It turns out that spectral and temporal phase analysis can be very useful for many applications in optical metrology.

Citation Download Citation

Hans J. Tiziani, Mahendra P. Kothiyal, Charles Joenathan, and Pascal Haible "Heterodyne temporal speckle pattern interferometry", Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); https://doi.org/10.1117/12.355067

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
2 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Interferometry

Speckle pattern

Heterodyning

Modulation

Phase shift keying

Fourier transforms

Linear filtering

Show All Keywords

Keywords/Phrases

Search In:

Publication Years