Two-wavelength interferometry based on a Fourier-transform technique

Ribun Onodera; Yukihiro Ishii

doi:10.1117/12.354820

19 July 1999 Two-wavelength interferometry based on a Fourier-transform technique

Ribun Onodera, Yukihiro Ishii

Proceedings Volume 3749, 18th Congress of the International Commission for Optics; (1999) https://doi.org/10.1117/12.354820
Event: ICO XVIII 18th Congress of the International Commission for Optics, 1999, San Francisco, CA, United States

Abstract

Two-wavelength interferometry that is based on a Fourier- transform technique has been investigated. A phase profile at a synthetic wavelength has been obtained by the inverse Fourier transformation of a first-order frequency spectrum for (lambda) ₁ wavelength and a minus first-order frequency spectrum for (lambda) ₂ wavelength. A power- spectrum of the two-wavelength interferogram can be controlled to eliminate a phase error caused by the difference between modulation intensities at two wavelengths.

Citation Download Citation

Ribun Onodera and Yukihiro Ishii "Two-wavelength interferometry based on a Fourier-transform technique", Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); https://doi.org/10.1117/12.354820

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