Characterization of optical parameters of an azo-dye-doped polymer PMMA thin film from spectroscopic ellipsometry

Guangbin Wang; Lisong Hou; Fuxi Gan

doi:10.1117/12.371164

30 November 1999 Characterization of optical parameters of an azo-dye-doped polymer PMMA thin film from spectroscopic ellipsometry

Guangbin Wang, Lisong Hou, Fuxi Gan

Author Affiliations +

Proceedings Volume 3806, Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks; (1999) https://doi.org/10.1117/12.371164
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

New azo dye-doped polymer thin films have been made by spin- coating method on single-crystal silicon substrates. The complex dielectric function and optical parameters of the films have been measured with a fixed angle of incidence automatic spectroscopic ellipsometer. The electronic structure of the films has been explained.

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Guangbin Wang, Lisong Hou, and Fuxi Gan "Characterization of optical parameters of an azo-dye-doped polymer PMMA thin film from spectroscopic ellipsometry", Proc. SPIE 3806, Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks, (30 November 1999); https://doi.org/10.1117/12.371164

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