Reflectance standards at ultraviolet wavelengths

Patricia Yvonne Barnes; Maria E. Nadal; Edward A. Early

doi:10.1117/12.364154

28 September 1999 Reflectance standards at ultraviolet wavelengths

Patricia Yvonne Barnes, Maria E. Nadal, Edward A. Early

Proceedings Volume 3818, Ultraviolet Atmospheric and Space Remote Sensing: Methods and Instrumentation II; (1999) https://doi.org/10.1117/12.364154
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

Polytetrafluoroethylene (PTFE) is widely used in remote sensing applications requiring a diffuse reflectance standard for detector calibration. The bi-directional and directional-hemispherical reflectance properties of both pressed and sintered PTFE were measured at ultraviolet wavelengths to provide information for their use as standards in this spectral range. The reflectance decreases with decreasing wavelength for both geometries, and the ratio between the reflectances for these geometries remains constant for wavelengths from 300 nm to 400 nm.

Citation Download Citation

Patricia Yvonne Barnes, Maria E. Nadal, and Edward A. Early "Reflectance standards at ultraviolet wavelengths", Proc. SPIE 3818, Ultraviolet Atmospheric and Space Remote Sensing: Methods and Instrumentation II, (28 September 1999); https://doi.org/10.1117/12.364154

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available