Paper
20 July 2000 Off-axis method of testing convex surfaces that utilizes optics of aperture smaller than that of the surface under test
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Abstract
An interferometric test is described that allows the testing of a convex surface from its reflective side with conjugate off-axis light beams. The apertures of the auxiliary optics are smaller than that of the surface under test. A method of centering the convex surface in the testing beams is presented.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rick Dale Blakley "Off-axis method of testing convex surfaces that utilizes optics of aperture smaller than that of the surface under test", Proc. SPIE 4003, Optical Design, Materials, Fabrication, and Maintenance, (20 July 2000); https://doi.org/10.1117/12.391499
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KEYWORDS
Sensors

Silicon

Optical spheres

Geometrical optics

Reflectivity

Beam splitters

Interferometry

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