Paper
24 May 2000 Effects of roughness in the side walls of optical waveguides on propagation loss
Kunihiko Asama, Tadashi Warikai, Hiroaki Kurokawa, Michiko Kuroda, Hiroyuki Kasai
Author Affiliations +
Proceedings Volume 4089, Optics in Computing 2000; (2000) https://doi.org/10.1117/12.386777
Event: 2000 International Topical Meeting on Optics in Computing (OC2000), 2000, Quebec City, Canada
Abstract
In this study we analyze the optical propagation properties due to the roughness of side walls in waveguides (core regions), which is inherent in the patterning processes such as RIE, UV curing and so on. In the analysis we evaluate the increase in loss due to the side-wall roughness, where the width of waveguides vary sinusoidally and randomly in the models. As a parameter, we pay attention to the relative refractive index different between the core and clad regions. The Finite-Difference Beam Propagation Method is used in the simulation. It is found that the increase in loss depends on the period varied in waveguides and the maximum value of loss is about 0.2 dB/cm in present conditions. However the large value of loss more than 1 dB/cm appears noticeably in some specific periods, and this is discussed using the Brillouin diagram.
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Kunihiko Asama, Tadashi Warikai, Hiroaki Kurokawa, Michiko Kuroda, and Hiroyuki Kasai "Effects of roughness in the side walls of optical waveguides on propagation loss", Proc. SPIE 4089, Optics in Computing 2000, (24 May 2000); https://doi.org/10.1117/12.386777
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KEYWORDS
Waveguides

Wave propagation

Refractive index

Beam propagation method

Ultraviolet radiation

Vertical cavity surface emitting lasers

Dispersion

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