Elliptically polarized white-light photoviscoelastic technique and its application

Satoru Yoneyama; Masahisa Takashi

doi:10.1117/12.429562

13 June 2001 Elliptically polarized white-light photoviscoelastic technique and its application

Satoru Yoneyama, Masahisa Takashi

Proceedings Volume 4317, Second International Conference on Experimental Mechanics; (2001) https://doi.org/10.1117/12.429562
Event: Second International Conference on Experimental Mechanics, 2000, Singapore, Singapore

Abstract

The present paper demonstrates the successful application of the photo viscoelastic technique using elliptically polarized white light to the stress field evaluation of the crack growth in a viscoelastic strip. Using the proposed technique, which can determine both iso chromatic and iso clinic parameters simultaneously from a single color image, the time-dependent stress intensity factor extended for linearly viscoelastic materials is evaluated from the experimental results using a method based on least-squares. The result show that the value of the prosed critical stress intensity factor for fast crack growth may be considered as a characteristic property of the material under monotonically increasing load.

Citation Download Citation

Satoru Yoneyama and Masahisa Takashi "Elliptically polarized white-light photoviscoelastic technique and its application", Proc. SPIE 4317, Second International Conference on Experimental Mechanics, (13 June 2001); https://doi.org/10.1117/12.429562

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