Subpicosecond optical damaging of silica: time-resolved measurements of the light-induced damage threshold

Saulius Juodkazis; Andrius Marcinkevicius; Mitsuru Watanabe; Vygantas Mizeikis; Shigeki Matsuo; Hiroaki Misawa

doi:10.1117/12.425013

12 April 2001 Subpicosecond optical damaging of silica: time-resolved measurements of the light-induced damage threshold

Saulius Juodkazis, Andrius Marcinkevicius, Mitsuru Watanabe, Vygantas Mizeikis, Shigeki Matsuo, Hiroaki Misawa

Author Affiliations +

Proceedings Volume 4347, Laser-Induced Damage in Optical Materials: 2000; (2001) https://doi.org/10.1117/12.425013
Event: Laser-Induced Damage in Optical Materials: 2000, 2000, Boulder, CO, United States

Abstract

We investigate damage of purified silica (transmission band down to 160 nm) by sub-ps light pulses having a wavelength of 795 nm. Illumination by 350 fs duration pulses focused by a high numerical aperture NA equals 1.35 microscope objective results in one of the lowest reported values for the single-shot bulk light-induced damage threshold (LIDT) of 5 J/cm², well below the critical self-focusing power in silica. We have also investigated peculiarities of damage by two coincident laser pulses (duration 440 fs) having power of about 0.5 x LIDT, and linearly cross-polarized to avoid interference effects. The reduction of LIDT in silica is demonstrated for an elevated lattice temperature T equals 400 K, at which the thermal linear/volume expansion coefficient has its maximum. Comparison between the LIDT values obtained from the numeric simulation and experiments demonstrates that the critical density of optically generated free carriers corresponding to LIDT n_cr approximately equal to 10²¹cm^-3 is reached during the first half time of the laser pulse illumination (0.2ps).

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Saulius Juodkazis, Andrius Marcinkevicius, Mitsuru Watanabe, Vygantas Mizeikis, Shigeki Matsuo, and Hiroaki Misawa "Subpicosecond optical damaging of silica: time-resolved measurements of the light-induced damage threshold", Proc. SPIE 4347, Laser-Induced Damage in Optical Materials: 2000, (12 April 2001); https://doi.org/10.1117/12.425013

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