Paper
19 April 2002 Design of a CMOS BDJ detector array for fluorescence imaging application
Gerard Sou, Guo Neng Lu
Author Affiliations +
Proceedings Volume 4755, Design, Test, Integration, and Packaging of MEMS/MOEMS 2002; (2002) https://doi.org/10.1117/12.462825
Event: Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS 2002, 2002, Cannes-Mandelieu, France
Abstract
The Buried Double Junction (BDJ) detector [1], which can be used either as a wavelength-sensitive device and as a photodetector, can be implemented in standard CMOS IC technologies, with no requirement for additional post process step. It has recently been applied to fluorescence detection [2]. The wavelength-sensitive operation of the CMOS BDJ detector is based on the wavelength dependence of the Silicon absorption coefficient a(X) in the visible range. An absorption length defined as 1(X) varies monotonically, from about 0. 1pm to several micrometers when the wavelength of an incident monochromatic light changes from 0.4 jim to 0.8 jim.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gerard Sou and Guo Neng Lu "Design of a CMOS BDJ detector array for fluorescence imaging application", Proc. SPIE 4755, Design, Test, Integration, and Packaging of MEMS/MOEMS 2002, (19 April 2002); https://doi.org/10.1117/12.462825
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Cited by 2 scholarly publications.
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KEYWORDS
Sensors

Detector arrays

CMOS sensors

Luminescence

Imaging arrays

Imaging systems

Silicon

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