Paper
29 July 2002 Use of reflection holograms in holographic interferometry and speckle correlation
Pierre Michel Boone
Author Affiliations +
Proceedings Volume 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life; (2002) https://doi.org/10.1117/12.484527
Event: Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, 2002, Novosibirsk, Russian Federation
Abstract
When a special case of a Denisyuk set-up [1] is used for double-exposure holographic interferometry, namely, with the photographic plate fixed to one point of the object under study and plane illumination normal to and through the plate, some interesting advantages can be obtained. The stability requirements are drastically reduced (a general translation and a rotation around an axis parallel to the illumination direction can be allowed); the optical set-up is very simple; white-light reconstruction can be used. For the determination of in-plane displacement patterns, one can either use fringe-order subtraction between two symmetrical off-axis views (eventually Moire subtraction), or use speckle correlation techniques. The most important advantage is that Cartesian components of displacements can be determined with complete object motion compensation by combining holographic and speckle techniques. Some practical applications ofthe method and its drawbacks are presented.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pierre Michel Boone "Use of reflection holograms in holographic interferometry and speckle correlation", Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); https://doi.org/10.1117/12.484527
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Holograms

Holography

Holographic interferometry

Moire patterns

Fringe analysis

Speckle

Distortion

Back to Top