Method to measure reflection-induced retardance without compensator

Zheng Ping Wang; Qingbo Li; Huili Wang; Ruiying Feng; Zongjun Huang; Xin Yu; Jinhui Shi

doi:10.1117/12.464300

20 September 2002 Method to measure reflection-induced retardance without compensator

Zheng Ping Wang, Qingbo Li, Huili Wang, Ruiying Feng, Zongjun Huang, Xin Yu, Jinhui Shi

Proceedings Volume 4927, Optical Design and Testing; (2002) https://doi.org/10.1117/12.464300
Event: Photonics Asia, 2002, Shanghai, China

Abstract

The measurement of reflection-induced retardance of optical devices is the usual case encountered in optical research, development and engineering. This kind of measurement usually can be completed using a linear polarizer and a retarder. A novel method used for the measurement of reflection-induced retardance employing a polarizer and an analyzer is proposed in this paper, the theoretical analysis of the method and an application example are given.

Citation Download Citation

Zheng Ping Wang, Qingbo Li, Huili Wang, Ruiying Feng, Zongjun Huang, Xin Yu, and Jinhui Shi "Method to measure reflection-induced retardance without compensator", Proc. SPIE 4927, Optical Design and Testing, (20 September 2002); https://doi.org/10.1117/12.464300

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