Paper
9 April 2003 Short-wavelength static optical recording properties of nickel phthalocynine thin film
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Proceedings Volume 5060, Sixth International Symposium on Optical Storage (ISOS 2002); (2003) https://doi.org/10.1117/12.510128
Event: Sixth International Symposium on Optical Storage (ISOS 2002), 2002, Wuhan, China
Abstract
Nickel phthalocyanine thin film was prepared by vacuum deposition, the absorption and transmission spectra, the thermal stability of the film were reported. And the static optical recording properties of the thin film were investigated with a self-developed short-wavelength optical tester with high NA objective lens. The results show that this film occupied suitable absorption and transmission properties for short-wavelength (514.5 nm) optical recording, excellent thermal stability and outstanding thermal decomposition characteristics. And high reflectivity contrast was obtained at low writing power and short writing pulse width using the Ar+ laser (514.5 nm) irradiation. The results indicate that metal phthalocyanine is not only qualified for traditional near infrared optical recording medium of CD-R, but also a promising candidate for the recording medium of green-light DVD-R.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yiqun Wu, Yang Wang, Donghong Gu, and Fuxi Gan "Short-wavelength static optical recording properties of nickel phthalocynine thin film", Proc. SPIE 5060, Sixth International Symposium on Optical Storage (ISOS 2002), (9 April 2003); https://doi.org/10.1117/12.510128
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KEYWORDS
Optical recording

Nickel

Absorption

Reflectivity

Thin films

Optical testing

Vacuum deposition

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