Paper
21 January 1985 Thermal (2-5.6 µm) Emittance Of Diathermanous Materials As A Function Of Optical Depth, Critical Angle And Temperature
R. H. Munis, S. J. Marshall
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Abstract
Thermal (2.0 μ - 5.6 μm) measurements of the normal emittance (EN) of several diathermanous materials were made at 15.2°C, 4.9°C and -5.6°C. Calculations of the total hemis-pherical emittance (EH) were made from EN and plotted against the optical depth (YΔλx). A comparison of these data with a model proposed by Gardon indicates that at near-ambient temperatures they agree very closely. It has been observed that EN > EH by ≈ 5% for both weakly and strongly absorbing materials. This is attributable to phase differences in the multiply reflected internal radiation attempting to exit the specimen throughout π steradians. Other radiation properties of the materials, i.e. diffuse transmittance (TD), absorption coefficient yΔx, and absorption index k were calculated.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. H. Munis and S. J. Marshall "Thermal (2-5.6 µm) Emittance Of Diathermanous Materials As A Function Of Optical Depth, Critical Angle And Temperature", Proc. SPIE 0510, Infrared Technology X, (21 January 1985); https://doi.org/10.1117/12.945025
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KEYWORDS
Absorption

Thermography

Data modeling

Transmittance

Imaging systems

Temperature metrology

Sensors

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