Characterization of polarization aberrations in liquid crystal devices

Justin Wolfe; Russell Chipman

doi:10.1117/12.505871

4 November 2003 Characterization of polarization aberrations in liquid crystal devices

Justin Wolfe, Russell Chipman

Proceedings Volume 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies; (2003) https://doi.org/10.1117/12.505871
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

Reflective Liquid Crystal on Silicon (LCoS) panels are widely used as light valves for projection displays. LCoS panels and the associated beam splitters, retardance films, and dichroic beam splitters display significant variations in polarization properties over the area, angle of incidence and spectral bandwidth of the projector. This paper surveys these polarization aberrations and describes a high speed Mueller Matrix Imaging Polarimeter (MMIP) for the characterization of these polarization aberrations. The characterization of projection systems and components by the MMIP enables advanced modeling and compensation of polarization aberrations.

Citation Download Citation

Justin Wolfe and Russell Chipman "Characterization of polarization aberrations in liquid crystal devices", Proc. SPIE 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, (4 November 2003); https://doi.org/10.1117/12.505871

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