Method for the optical measurement of size and complex index of laser damage precursors in optical components

Laurent Gallais; Philippe Voarino; Jean-Yves Natoli; Claude Amra

doi:10.1117/12.513414

25 February 2004 Method for the optical measurement of size and complex index of laser damage precursors in optical components

Laurent Gallais, Philippe Voarino, Jean-Yves Natoli, Claude Amra

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Proceedings Volume 5250, Advances in Optical Thin Films; (2004) https://doi.org/10.1117/12.513414
Event: Optical Systems Design, 2003, St. Etienne, France

Abstract

Laser damage in optical components is caused mainly by the presence of sub-micronic defects, inherent to the manufacturing process (metal or dielectric inclusions, fractures, bubbles). An improvement of the laser damage threshold requires an analysis of damage process and an identification of the laser damage precursors. However, the assumed nanometer size of such precursors makes their identification difficult by the usual optical methods. In this paper, we present a method to obtain the size and complex index of laser damage precursors in thin films or substrates. This method is based on the knowledge of three parameters accessible to measurements, which are the precursor density, the laser damage threshold and the precursor absorption. Density and threshold are extracted from the fit of laser damage probability curves with the use of a statistic model and absorption is obtained with photothermal measurements. From these measurements, an electromagnetic and thermal model permits to obtain an estimation of both complex index and size of the laser damage precursors. The different experimental and theoretical tools are described in this paper : laser damage testing apparatus, photothermal bench, stochastic model for the interpretation of laser damage probability curves, electromagnetic and thermal model. An application example is given : we present our first results in silica thins films where sub-micronic laser damage initiators at 1064nm have been highlighted and identified with our method.

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Laurent Gallais, Philippe Voarino, Jean-Yves Natoli, and Claude Amra "Method for the optical measurement of size and complex index of laser damage precursors in optical components", Proc. SPIE 5250, Advances in Optical Thin Films, (25 February 2004); https://doi.org/10.1117/12.513414

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KEYWORDS

Laser induced damage

Particles

Absorption

Silica

Laser damage threshold

Thin films

Dielectrics

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