Study of surface contamination layer in silica thanks to laser damage investigation

Bertrand Bertussi; Jean-Yves Natoli; Mireille Commandre; Claude Amra

doi:10.1117/12.524394

10 June 2004 Study of surface contamination layer in silica thanks to laser damage investigation

Bertrand Bertussi, Jean-Yves Natoli, Mireille Commandre, Claude Amra

Proceedings Volume 5273, Laser-Induced Damage in Optical Materials: 2003; (2004) https://doi.org/10.1117/12.524394
Event: XXXV Annual Symposium on Optical Materials for High Power Lasers: Boulder Damage Symposium, 2003, Boulder, Colorado, United States

Abstract

During the first steps of optical silica substrate preparation, cracks due to mechanical stress appear on the surface in a thickness of a few microns. The following stage of polishing is useful to reduce those cracks and to decrease the roughness thanks to specific abrasive liquids. The consequence of this process is a contamination of the silica on the considered layer. These different contaminants could be suspected to be precursor centers of laser damage. An estimation of this critical thickness can be done by studying the morphology of the laser-induced damages. Results obtained by observation after irradiation with an atomic force microscope confirms that a thickness of a few microns seems to be involved. The study proposed here, consists in an investigation of the layer which is responsible of surface damages. We use a statistical model previously developed to determine the precursors density from laser damage probability curves. At first, we will present results based on the study of liquids used for the polishing of bare silica glasses. Subsequently, we will correlate these results with the laser-induced damage threshold of the substrates. Finally, we will describe a method allowing us to measure the thickness of this surface contamination layer. To illustrate our purpose, we will present results achieved on bare silica.

Citation Download Citation

Bertrand Bertussi, Jean-Yves Natoli, Mireille Commandre, and Claude Amra "Study of surface contamination layer in silica thanks to laser damage investigation", Proc. SPIE 5273, Laser-Induced Damage in Optical Materials: 2003, (10 June 2004); https://doi.org/10.1117/12.524394

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
5 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Liquids

Silica

Surface finishing

Laser induced damage

Polishing

Contamination

Laser irradiation

Show All Keywords

Keywords/Phrases

Search In:

Publication Years