Paper
17 August 2004 Studies of the properties of the temporal phase-shifting method applied to silicone microelement vibration investigations using the time-average method
Krzysztof Patorski, Zbigniew Sienicki, Michal Pawlowski, Adam R. Styk, Agata Józwicka
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Abstract
Numerical simulations of the influence the phase step miscalibration and average intensity differentiation between the frames on the calculated interferogram contrast using the temporal phase shifting method (TPS) are presented. The fringe function includes in its argument the amplitude of vibration studied by the time-average method. Some features of the TPS method known from the interferogram phase calculations are confirmed and properties characteristic to contrast determination are established. Experimental studies of vibration resonant mode patterns of silicone microelements provide corroboration of theoretical and numerical findings.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Krzysztof Patorski, Zbigniew Sienicki, Michal Pawlowski, Adam R. Styk, and Agata Józwicka "Studies of the properties of the temporal phase-shifting method applied to silicone microelement vibration investigations using the time-average method", Proc. SPIE 5458, Optical Micro- and Nanometrology in Manufacturing Technology, (17 August 2004); https://doi.org/10.1117/12.545450
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KEYWORDS
Modulation

Phase shift keying

Silicon

Error analysis

Fringe analysis

Solids

Phase shifts

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