Cryogenic Production Testing

R. K. Buchness; E. Banks; J. Doidge; A. Gable; L. Nelson; D. Olsen

doi:10.1117/12.948858

28 October 1985 Cryogenic Production Testing

R. K. Buchness, E. Banks, J. Doidge, A. Gable, L. Nelson, D. Olsen

Proceedings Volume 0550, Sensor Design Using Computer Tools II; (1985) https://doi.org/10.1117/12.948858
Event: 1985 Technical Symposium East, 1985, Arlington, United States

Abstract

Rockwell has realized rapid testing of Infrared Focal Plane Arrays (IRFPAs) using a totally automated cryogenic test station with the latest technology in device handling, data acquisition, illumination and throughput capabilities. This station provides testing of HgCdTe Focal Plane Arrays fabricated in a fully certified production facility. All aspects of this facility are under Quality Control surveillance including the hardware and software used by the automated test station.

Citation Download Citation

R. K. Buchness, E. Banks, J. Doidge, A. Gable, L. Nelson, and D. Olsen "Cryogenic Production Testing", Proc. SPIE 0550, Sensor Design Using Computer Tools II, (28 October 1985); https://doi.org/10.1117/12.948858

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