Paper
25 October 2004 Development of automatic inspection of defect of compact camera module
Kuk Won Ko, Yu Jin Lee, Beong Wuk Choi, Kyoung Cheol Koh, Jong Hyeong Kim
Author Affiliations +
Proceedings Volume 5603, Machine Vision and its Optomechatronic Applications; (2004) https://doi.org/10.1117/12.577570
Event: Optics East, 2004, Philadelphia, Pennsylvania, United States
Abstract
Compact Camera Module(CCM) is widely used in PDA, Celluar phone and PC web camera. With the greatly increasing use for mobile applications, there has been a considerable demands for high speed production of CCM. The major burden of production of CCM is assembly of lens module onto CCD or CMOS packaged circuit board. After module is assembled, the CCM is inspected. In this paper, we developed the image capture board for CCM and the imaging processing algorithm to inspect the defects in captured image of assembled CCMO. The performances of the developed inspection system and its algorithm are tested on samples of 10000 CCMs. Experimental results reveal that the proposed system can focus the lens of CCM within 5s and we can recognize various types of defect of CCM modules with good accuracy and high speed.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kuk Won Ko, Yu Jin Lee, Beong Wuk Choi, Kyoung Cheol Koh, and Jong Hyeong Kim "Development of automatic inspection of defect of compact camera module", Proc. SPIE 5603, Machine Vision and its Optomechatronic Applications, (25 October 2004); https://doi.org/10.1117/12.577570
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Cited by 1 scholarly publication.
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KEYWORDS
Inspection

CMOS sensors

Algorithm development

Image sensors

Defect inspection

Cameras

Image processing

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