Paper
25 October 2004 High-precision on-machine 3D shape measurement using hypersurface calibration method
Taeho Ha, Yasuhiro Takaya, Takashi Miyoshi, Shingo Ishizuka, Tatsuhiko Suzuki
Author Affiliations +
Proceedings Volume 5603, Machine Vision and its Optomechatronic Applications; (2004) https://doi.org/10.1117/12.571001
Event: Optics East, 2004, Philadelphia, Pennsylvania, United States
Abstract
We present a high-precision fringe pattern projection technique based on a novel 4D hypersurface calibration method, and its application to on-machine measurement of raw-stocks in die-making industry. Our fringe pattern projection technique has the following feature. In the calibration stage, coordinates (x, y) of a CCD image sensor correspond uniquely, for every calibration plane with height Zi (i=1,..,n), to a phase φ of a projected fringe pattern, and coordinates (X , Y) of a machine tool. These relationships are converted to hypersurfaces in 4D spaces of (x, y, Z, φ), (x, y, Z, X), and (x, y, Z, Y), which are considered to be a sort of function. Using these hypersurfaces, a measured data of (x, y, φ) is transformed to machine tool coordinates (X, Y, Z). Our hypersurface calibration method is expected to minimize systematic errors, because it inputs an observed data (x, y, φ) into precise interpolation functions created using actual measurement data, and accordingly systematic errors are cancelled. The repeatability, systematic errors, and random errors obtained from the experiment show that our measurement system has a potential for highly accurate non-contact 3D shape measurement.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Taeho Ha, Yasuhiro Takaya, Takashi Miyoshi, Shingo Ishizuka, and Tatsuhiko Suzuki "High-precision on-machine 3D shape measurement using hypersurface calibration method", Proc. SPIE 5603, Machine Vision and its Optomechatronic Applications, (25 October 2004); https://doi.org/10.1117/12.571001
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CITATIONS
Cited by 11 scholarly publications.
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KEYWORDS
Calibration

3D metrology

Fringe analysis

Optical spheres

CCD image sensors

LCDs

Data modeling

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