Research and development of heterodyne dispersion meter

Shu-Jen Liao; Shinn-Fwu Wang; Ming-Hung Chiu; Chih-Wen Lai; Rong-Seng Chang

doi:10.1117/12.572661

10 February 2005 Research and development of heterodyne dispersion meter

Shu-Jen Liao, Shinn-Fwu Wang, Ming-Hung Chiu, Chih-Wen Lai, Rong-Seng Chang

Proceedings Volume 5638, Optical Design and Testing II; (2005) https://doi.org/10.1117/12.572661
Event: Photonics Asia, 2004, Beijing, China

Abstract

A heterodyne dispersion meter based on total-internal reflection effects and common-path configuration is presented. It is used to measuring the dispersion power of an optical material or component for many applications in industries. The phase difference between S and P-polarizations at the total-internal reflection condition can be extracted and measured accurately by using heterodyne interferometry. The constants of dispersion formulas built by traditional ways could be revised by this method. It has some merits, such as, high resolution and stability, easy to operate, and real-time measurement.

Citation Download Citation

Shu-Jen Liao, Shinn-Fwu Wang, Ming-Hung Chiu, Chih-Wen Lai, and Rong-Seng Chang "Research and development of heterodyne dispersion meter", Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); https://doi.org/10.1117/12.572661

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