Paper
13 June 2005 Wavelet transform analysis of truncated fringe patterns in 3-D surface profilometry
Sai Siva Gorthi, Kameswara Rao Lolla
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Abstract
Wavelet transform analysis of projected fringe pattern for phase recovery in 3-D shape measurement of objects is investigated. The present communication specifically outlines and evaluates the errors that creep in to the reconstructed profiles when fringe images do not satisfy periodicity. Three specific cases that give raise to non-periodicity of fringe image are simulated and leakage effects caused by each one of them are analyzed with continuous complex Morlet wavelet transform. Same images are analyzed with FFT method to make a comparison of the reconstructed profiles with both methods. Simulation results revealed a significant advantage of wavelet transform profilometry (WTP), that the distortions that arise due to leakage are confined to the locations of discontinuity and do not spread out over the entire projection as in the case of Fourier transform profilometry (FTP).
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sai Siva Gorthi and Kameswara Rao Lolla "Wavelet transform analysis of truncated fringe patterns in 3-D surface profilometry", Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); https://doi.org/10.1117/12.612634
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Cited by 7 scholarly publications.
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KEYWORDS
Wavelet transforms

Fourier transforms

Fringe analysis

Error analysis

Wavelets

Image processing

Computer simulations

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