Paper
14 October 2005 Use of aplanatic condition to sample extended objects: application to merit function segmentation
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Abstract
The use of a segmented merit functions in the optical design process is a good strategy to improve the optimization trajectories, however to reach good results it is necessary to change the segmentation of the merit function during the optimization. In this work we present a new application of the aplanatism condition, where it is used as a method to segment the merit function when extended objects are involved in the merit function definition. Our method begins with an equally distributed first sampling of the object to evaluate how far the sampled point is from the aplanatic condition. This initial value collection are used to obtain a second sampling of the object that provides the appropriate number of object field points that must be taken into account to use in the merit function. The use of the aplanatic condition to obtain dynamic merit function segmentation is especially important when large object fields are involved in the design process. We have tested the method using a wide field of view objective. The final objective configuration was obtained twice, one with a standard segmentation of the merit function (on axis, zonal point and full field) and two, with our method. The merit function, the optimization strategy, the variables and the initial system used are the same for both optimizations.
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J. Arasa, C. Pizarro, and J. A. Diaz "Use of aplanatic condition to sample extended objects: application to merit function segmentation", Proc. SPIE 5962, Optical Design and Engineering II, 59620H (14 October 2005); https://doi.org/10.1117/12.625175
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KEYWORDS
Optical design

Optimization (mathematics)

Image segmentation

Objectives

Chromatic aberrations

Diffraction

Ray tracing

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